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1

3 is a more promising algorithmic parameter than 2

M Kaykobad, Md.M Islam, M.E Amyeen, M.M Murshed

Journal:

Computers & Mathematics with Applications

Year:

1998

Language:

english

File:

PDF, 448 KB

english, 1998

2

Fault equivalence identification in combinational circuits using implication and evaluation techniques

Amyeen, M.E., Fuchs, W.K., Pomeranz, I., Boppana, V.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2003

Language:

english

File:

PDF, 782 KB

english, 2003

3

Factors Influencing Patient Satisfaction Undergoing Endoscopic Procedures

Hin Hin Ko, Hongbin Zhang, Amyeen Hassanali, Rahim Manji, Pooya Kazemi, Lukasz Soswa, Jennifer Telford, Robert A. Enns

Journal:

Gastrointestinal Endoscopy

Year:

2007

Language:

english

File:

PDF, 51 KB

english, 2007

4

Patient Satisfaction with Endoscopy Is Influenced By the Timing of the Survey

Hin Hin Ko, Hongbin Zhang, Amyeen Hassanali, Rahim Manji, Pooya Kazemi, Lukasz Soswa, Jennifer J. Telford, Robert A. Enns

Journal:

Gastrointestinal Endoscopy

Year:

2007

Language:

english

File:

PDF, 51 KB

english, 2007

5

Predictors for Small Bowel Tumours in Capsule Endoscopy: Are There Any?

Joanna K. Law, Pongphob Intaraprasong, Pooya Kazemi, Lukasz Soswa, Amyeen Hassanali, Isaiah D. Bregman, Wiley Chung, Samuel E. Krausz, Robert A. Enns

Journal:

Gastrointestinal Endoscopy

Year:

2008

Language:

english

File:

PDF, 53 KB

english, 2008

6

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Testing for systematic defects based on DFM guidelines

Dongok Kim,, Amyeen, M. Enamul, Srikanth Venkataraman,, Pomeranz, Irith, Swagato Basumallick,, Landau, Berni

Year:

2007

Language:

english

File:

PDF, 197 KB

english, 2007

7

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Microprocessor system failures debug and fault isolation methodology

Amyeen, M. Enamul, Venkataraman, Srikanth, Mak, Mun Wai

Year:

2009

Language:

english

File:

PDF, 984 KB

english, 2009

8

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - An Experimental Study of N-Detect Scan ATPG Patterns on a Processor

Venkataraman, S., Sivaraj, S., Amyeen, E., Sangbong Lee,, Ojha, A., Ruifeng Guo,

Year:

2004

Language:

english

File:

PDF, 1.30 MB

english, 2004

9

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Logic BIST silicon debug and volume diagnosis methodology

Amyeen, M. Enamul, Jayalakshmi, Andal, Venkataraman, Srikanth, Pathy, Sundar V., Tan, Ewe C.

Year:

2011

Language:

english

File:

PDF, 719 KB

english, 2011

10

[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Defect diagnosis based on DFM guidelines

Kim, Dongok, Pomeranz, Irith, Amyeen, M. Enamul, Venkataraman, Srikanth

Year:

2010

Language:

english

File:

PDF, 598 KB

english, 2010

11

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Improving Precision Using Mixed-level Fault Diagnosis

Amyeen, M., Nayak, Debashis, Venkataraman, Srikanth

Year:

2006

Language:

english

File:

PDF, 9.35 MB

english, 2006

12

[IEEE Comput. Soc 19th IEEE VLSI Test Symposium. VTS 2001 - Marina Del Rey, CA, USA (29 April-3 May 2001)] Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 - Fault equivalence identification using redundancy information and static and dynamic extraction

Amyeen, M.E., Fuchs, W.K., Pomeranz, I., Boppana, V.

Year:

2001

Language:

english

File:

PDF, 715 KB

english, 2001

13

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Theorems for efficient identification of indistinguishable fault pairs in synchronous sequential circuits

Enamul Amyeen, M., Pomeranz, I., Kent Fuchs, W.

Year:

2002

Language:

english

File:

PDF, 322 KB

english, 2002

14

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive

Ruifeng Guo,, Mitra, S., Amyeen, E., Jinkyu Lee,, Sivaraj, S., Venkataraman, S.

Year:

2006

Language:

english

File:

PDF, 309 KB

english, 2006

15

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Using Scan-Dump Values to Improve Functional-Diagnosis Methodology

Vimjam, Vishnu C., Amyeen, M. Enamul, Guo, Ruifeng, Venkataraman, Srikanth, Hsiao, Michael, Yang, Kai

Year:

2007

Language:

english

File:

PDF, 283 KB

english, 2007

16

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Evaluation of the quality of N-detect scan ATPG patterns on a processor

Amyeen, M.E., Venkataraman, S., Ojha, A., Sangbong Lee,

Year:

2004

Language:

english

File:

PDF, 1.04 MB

english, 2004

17

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Concurrent execution of diagnostic fault simulation and equivalence identification during diagnostic test generation

Xiaoming Yu,, Enamul Amyeen, M., Venkataraman, S., Ruifeng Guo,, Pomeranz, I.

Year:

2003

Language:

english

File:

PDF, 397 KB

english, 2003

18

[ACM Press the 24th edition of the great lakes symposium - Houston, Texas, USA (2014.05.21-2014.05.23)] Proceedings of the 24th edition of the great lakes symposium on VLSI - GLSVLSI '14 - Built-in generation of functional broadside tests considering primary input constraints

Yao, Bo, Pomeranz, Irith, Venkataraman, Srikanth, Amyeen, Enamul

Year:

2014

Language:

english

File:

PDF, 804 KB

english, 2014

19

Diagnostic Fail Data Minimization Using an N-Cover Algorithm

Bodhe, Shraddha, Amyeen, M. Enamul, Pomeranz, Irith, Venkataraman, Srikanth

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 836 KB

english, 2015

20

[IEEE Comput. Soc . 17th International Conference on VLSI Design - Mumbai, India (5-9 Jan. 2004)] Proceedings. 17th International Conference on VLSI Design - Defect diagnosis based on pattern-dependent stuck-at faults

Pomeranz, I., Srikanth Venkataraman,, Reddy, S.M., Amyeen, E.

Year:

2004

Language:

english

File:

PDF, 259 KB

english, 2004

21

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - Innovative practices session 5C: Advancements in test -keeping moore moving!

Year:

2015

Language:

english

File:

PDF, 114 KB

english, 2015

22

[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Implication and evaluation techniques for proving fault equivalence

Enamul Amyeen, M., Fuchs, W.K., Pomeranz, I., Boppana, V.

Year:

1999

Language:

english

File:

PDF, 128 KB

english, 1999

23

[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm

Bodhe, Shraddha, Amyeen, M. Enamul, Galendez, Clariza, Mooers, Houston, Pomeranz, Irith, Venkataraman, Srikanth

Year:

2016

Language:

english

File:

PDF, 379 KB

english, 2016

24

Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction

Bodhe, Shraddha, Pomeranz, Irith, Amyeen, M. Enamul, Venkataraman, Srikanth

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 2.75 MB

english, 2017

25

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Diagnostic resolution improvement through learning-guided physical failure analysis

Lim, Carlston, Xue, Yang, Li, Xin, Blanton, Ronald D., Amyeen, M. Enamul

Year:

2016

Language:

english

File:

PDF, 189 KB

english, 2016

26

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - A novel diagnostic test generation methodology and its application in production failure isolation

Amyeen, M. Enamul, Kim, Dongok, Chandrasekar, Maheshwar, Noman, Mohammad, Venkataraman, Srikanth, Jain, Anurag, Goel, Neha, Sharma, Ramesh

Year:

2016

Language:

english

File:

PDF, 515 KB

english, 2016

27

Test Modification for Reduced Volumes of Fail Data

Pomeranz, Irith, Amyeen, M. Enamul, Venkataraman, Srikanth

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2017

Language:

english

File:

PDF, 240 KB

english, 2017

28

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure

Venkataraman, Srikanth, Pomeranz, Irith, Bodhe, Shraddha, Amyeen, M. Enamul

Year:

2017

Language:

english

File:

PDF, 164 KB

english, 2017

29

Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume

Pomeranz, Irith, Amyeen, M. Enamul

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2020

File:

PDF, 177 KB

2020

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